29 April 2003 Three-dimensional profilometry using liquid crystal grating
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Proceedings Volume 5058, Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002; (2003) https://doi.org/10.1117/12.509410
Event: Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002, 2002, Beijing, China
Abstract
This paper describes a device for 3D profile measurement systems, which are based on grating projection method using phase shifting technique for fringe analysis. As a key component of these systems, we propose to apply a liquid crystal (LC) grating instead of a conventional ruled grating, which has difficulty in speedy and accurate shifting of the projected pattern. This LC grating consists of 960 lines of stripe pattern on the substrate of 60×40 mm2 in size and has such features as 8 bits of gray levels in dynamic range in use of mono-chromatic applications. A sinusoidal pattern as well as a binary pattern in realized by combining pulse width modulation control and frame ratio control technqiue. In addition, the period of the pattern is arbitrarily controlled and shifting of the projected pattern is also electrically realized. We demonstrate a few examples measured by the system which uses this LC grating inside.
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Hiroo Fujita, Hiroo Fujita, Ken Yamatan, Ken Yamatan, Masayuki Yamamoto, Masayuki Yamamoto, Yukitoshi Otani, Yukitoshi Otani, Akira Suguro, Akira Suguro, Shigeru Morokawa, Shigeru Morokawa, Toru Yoshizawa, Toru Yoshizawa, } "Three-dimensional profilometry using liquid crystal grating", Proc. SPIE 5058, Optical Technology and Image Processing for Fluids and Solids Diagnostics 2002, (29 April 2003); doi: 10.1117/12.509410; https://doi.org/10.1117/12.509410
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