9 April 2003 Analysis of short-wavelength recording properties of AgInSbTe thin films
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Proceedings Volume 5060, Sixth International Symposium on Optical Storage (ISOS 2002); (2003) https://doi.org/10.1117/12.510310
Event: Sixth International Symposium on Optical Storage (ISOS 2002), 2002, Wuhan, China
Abstract
The relationships among the recording laser power, laser pulse width, and the recording properties of Ag5In5Sb47Te33 thin films were investigated, and the morphology of the recording domains were directly observed by using the homemade apparatus. The results show that the clear and high reflectivity contrast recording domains can be obtained when the laser energy is in a certain range. By optimizing the recording condition, the recording domains with a diameter of 380 to 400 nm and reflectivity contrast of 22% are obtained under the recording power of 12 mW and pulse width of 90 ns.
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Jingsong Wei, Hao Ruan, Fuxi Gan, "Analysis of short-wavelength recording properties of AgInSbTe thin films", Proc. SPIE 5060, Sixth International Symposium on Optical Storage (ISOS 2002), (9 April 2003); doi: 10.1117/12.510310; https://doi.org/10.1117/12.510310
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