Paper
9 April 2003 Method for evaluation of the lifetime of magneto-optical recording
Chengtao Yang, Shuren Zhang, Yanrong Li
Author Affiliations +
Proceedings Volume 5060, Sixth International Symposium on Optical Storage (ISOS 2002); (2003) https://doi.org/10.1117/12.510260
Event: Sixth International Symposium on Optical Storage (ISOS 2002), 2002, Wuhan, China
Abstract
The lifetime and reliability of optical media are discussed on the magneto-optical (MO) disk media. The experiments were applying the method conventionally used for MO disk. Based on accelerated aging experimental study, which the magneto-optical disk media are subjected to conditions of high temperature and high humidity, the reliability lifetime was obtained by analyzing the change of BER and CNR at high temperature experiment. The rate of failure was measured and the data were extrapolated to obtain rates of failure under the ambient conditions. We predicated the reliability life of MO disks by using the Weibull method. The research provided that the lifetime of magneto-optical disks was sufficiently long.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chengtao Yang, Shuren Zhang, and Yanrong Li "Method for evaluation of the lifetime of magneto-optical recording", Proc. SPIE 5060, Sixth International Symposium on Optical Storage (ISOS 2002), (9 April 2003); https://doi.org/10.1117/12.510260
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KEYWORDS
Molybdenum

Reliability

Multilayers

Data storage

Failure analysis

Oxidation

Terbium

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