Photometric Analysis of Bioluminescent Image
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 1 (1 April 2003); doi: 10.1117/12.501362
Improvements in Photometry by Using a Pyroelectric Polymer Sensor and Optical Fibers
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 11 (1 April 2003); doi: 10.1117/12.501363
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 18 (1 April 2003); doi: 10.1117/12.501365
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 22 (1 April 2003); doi: 10.1117/12.501367
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 27 (1 April 2003); doi: 10.1117/12.501377
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 31 (1 April 2003); doi: 10.1117/12.501378
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 33 (1 April 2003); doi: 10.1117/12.501379
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 38 (1 April 2003); doi: 10.1117/12.501381
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 43 (1 April 2003); doi: 10.1117/12.501382
Spectrometry of Thin Film Systems, Light Scattering Materials, and Other Measuring Applications of Spectroscopy
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 47 (1 April 2003); doi: 10.1117/12.501383
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 62 (1 April 2003); doi: 10.1117/12.501384
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 69 (1 April 2003); doi: 10.1117/12.501385
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 75 (1 April 2003); doi: 10.1117/12.501386
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 84 (1 April 2003); doi: 10.1117/12.501391
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 91 (1 April 2003); doi: 10.1117/12.501394
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 98 (1 April 2003); doi: 10.1117/12.501396
Scatterometry and Nephelometry in Research and Technology
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 103 (1 April 2003); doi: 10.1117/12.501399
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 109 (1 April 2003); doi: 10.1117/12.501405
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 114 (1 April 2003); doi: 10.1117/12.501409
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 122 (1 April 2003); doi: 10.1117/12.509704
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 128 (1 April 2003); doi: 10.1117/12.501411
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 132 (1 April 2003); doi: 10.1117/12.501413
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 138 (1 April 2003); doi: 10.1117/12.501414
Reflectometry, Polarimetry, and Interferometry
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 146 (1 April 2003); doi: 10.1117/12.501415
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 151 (1 April 2003); doi: 10.1117/12.501419
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 158 (1 April 2003); doi: 10.1117/12.509705
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 167 (1 April 2003); doi: 10.1117/12.501421
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 172 (1 April 2003); doi: 10.1117/12.501424
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 182 (1 April 2003); doi: 10.1117/12.501513
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 191 (1 April 2003); doi: 10.1117/12.501515
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 198 (1 April 2003); doi: 10.1117/12.501517
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 206 (1 April 2003); doi: 10.1117/12.501518
Lightmetry in Technologies of Lightguides and their Applications
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 210 (1 April 2003); doi: 10.1117/12.501519
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 222 (1 April 2003); doi: 10.1117/12.501520
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 230 (1 April 2003); doi: 10.1117/12.501521
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 236 (1 April 2003); doi: 10.1117/12.501523
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 241 (1 April 2003); doi: 10.1117/12.501525
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 245 (1 April 2003); doi: 10.1117/12.501526
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 252 (1 April 2003); doi: 10.1117/12.501530
Light Sources (Lasers, Diodes), Photodetectors, and Testing of Semiconductor Devices Using Light
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 257 (1 April 2003); doi: 10.1117/12.501531
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 265 (1 April 2003); doi: 10.1117/12.501532
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 269 (1 April 2003); doi: 10.1117/12.501534
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 275 (1 April 2003); doi: 10.1117/12.501536
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 281 (1 April 2003); doi: 10.1117/12.501538
Varia: New Approach to Light Transmission through Thin Film Systems and Tissues, Optical Tomography, Studies of Dispersed Liquid Crystals, Vision Systems of Robots, and Studies of Plasma Deposits
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 287 (1 April 2003); doi: 10.1117/12.501539
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 295 (1 April 2003); doi: 10.1117/12.509706
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 303 (1 April 2003); doi: 10.1117/12.501540
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 309 (1 April 2003); doi: 10.1117/12.501541
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 319 (1 April 2003); doi: 10.1117/12.501542
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 328 (1 April 2003); doi: 10.1117/12.501545
Proc. SPIE 5064, Lightmetry 2002: Metrology and Testing Techniques Using Light, pg 331 (1 April 2003); doi: 10.1117/12.501548
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