An In<sub>0.6</sub>Ga<sub>0.4</sub>As/GaAs quantum dot infrared photodetector with operating temperature up to 260K

Lin Jiang; Sheng S. Li; Nien-Tze Yeh; Jen-Inn Chyi

doi:10.1117/12.487034

10 October 2003 An In_0.6Ga_0.4As/GaAs quantum dot infrared photodetector with operating temperature up to 260K

Lin Jiang, Sheng S. Li, Nien-Tze Yeh, Jen-Inn Chyi

Proceedings Volume 5074, Infrared Technology and Applications XXIX; (2003) https://doi.org/10.1117/12.487034
Event: AeroSense 2003, 2003, Orlando, Florida, United States

Abstract

A high-sensitivity In_0.6Ga_0.4As/GaAs quantum-dot infrared photodetector (QDIP) with detection waveband in 6.7 to approximately 11.5 μm and operating temperature up to 260K under normal incident illumination has been demonstrated. The peak detection wavelength shifts from 7.6 μm to 8.4 μm when the temperature rises from 40 to 260K. The background limited performance (BLIP) detectivity (D*_BLIP) measured at V_b=1.5 V, T=77K and λ_p = 7.6 μm was found to be 1.25 x 10¹⁰ cm-Hz^1/2/W, with a corresponding responsivity of 0.22A/W. The high operating temperature is attributed to the very low dark current and long carrier lifetime in the quantum dots of this device. The results show that this QDIP can operate at high temperature without using the large band gap material such as AlGaAs or InGaP as blocking barrier to reduce the device dark current.

Citation Download Citation

Lin Jiang, Sheng S. Li, Nien-Tze Yeh, and Jen-Inn Chyi "An In_0.6Ga_0.4As/GaAs quantum dot infrared photodetector with operating temperature up to 260K", Proc. SPIE 5074, Infrared Technology and Applications XXIX, (10 October 2003); https://doi.org/10.1117/12.487034

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