Paper
10 October 2003 Polycrystalline PbSe x-y addressed uncooled FPAs
M. Carmen Torquemada, Victor Villamayor, M. T. Rodrigo, German Vergara, Fernando J. Sanchez, Rosa Almazan, Marina Verdu, Purificacion Rodriguez, Luis J. Gomez, Teresa Maria Montojo
Author Affiliations +
Abstract
A technology for processing low density uncooled focal plane arrays (FPAs) of polycrystalline PbSe has been developed. PbSe is deposited, processed and sensitized on a silicon substrate with two levels of metal separated by a thin dielectric layer of SiO2. An x-y addressed type read out permits a reduced number of leads and high filling factors. Unlike standard polycrystalline PbSe processing method we deposit PbSe by sublimation in vacuum. As-deposited, PbSe is not sensitive to IR light. In order to turn it photosensitive it is necessary to expose the films to specific thermal treatments. We have developed a very efficient sensitization process during which substrates withstand temperatures as high as 450°C. As a technology demonstrator, a low density (8x8 elements) PbSe FPA has been processed. Room temperature detectivities typically yield values of Dλ* (500 K, 300 Hz, 1.2 Hz) approximately 3 x 109 cm Hz1/2/W. The technological capabilities developed can be easily extended to more dense arrays.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Carmen Torquemada, Victor Villamayor, M. T. Rodrigo, German Vergara, Fernando J. Sanchez, Rosa Almazan, Marina Verdu, Purificacion Rodriguez, Luis J. Gomez, and Teresa Maria Montojo "Polycrystalline PbSe x-y addressed uncooled FPAs", Proc. SPIE 5074, Infrared Technology and Applications XXIX, (10 October 2003); https://doi.org/10.1117/12.485845
Lens.org Logo
CITATIONS
Cited by 16 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Sensors

Chemical elements

Scanning electron microscopy

Staring arrays

Image processing

Lead

Silicon

RELATED CONTENT

Far-infrared focal plane development for SIRTF
Proceedings of SPIE (July 01 1992)
Morphology and structure of PZT films
Proceedings of SPIE (June 10 2006)
Recent Advances In Z-Technology Architecture
Proceedings of SPIE (September 13 1989)
Focal Plane Architecture: An Overview
Proceedings of SPIE (May 07 1980)
Packaging of electronics for on and off FPA signal...
Proceedings of SPIE (November 01 1990)

Back to Top