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12 September 2003 Concepts using optical MEMS array for ladar scene projection
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Scene projection for HITL testing of LADAR seekers is unique because the 3rd dimension is time delay. Advancement in AFRL for electronic delay and pulse shaping circuits, VCSEL emitters, fiber optic and associated scene generation is underway, and technology hand-off to test facilities is expected eventually. However, size and cost currently projected behooves cost mitigation through further innovation in system design, incorporating new developments, cooperation, and leveraging of dual-purpose technology. Therefore a concept is offered which greatly reduces the number (thus cost) of pulse shaping circuits and enables the projector to be installed on the mobile arm of a flight motion simulator table without fiber optic cables. The concept calls for an optical MEMS (micro-electromechanical system) steerable micro-mirror array. IFOV’s are a cluster of four micro-mirrors, each of which steers through a unique angle to a selected light source with the appropriate delay and waveform basis. An array of such sources promotes angle-to-delay mapping. Separate pulse waveform basis circuits for each scene IFOV are not required because a single set of basis functions is broadcast to all MEMS elements simultaneously. Waveform delivery to spatial filtering and collimation optics is addressed by angular selection at the MEMS array. Emphasis is on technology in existence or under development by the government, its contractors and the telecommunications industry. Values for components are first assumed as those that are easily available. Concept adequacy and upgrades are then discussed. In conclusion an opto-mechanical scan option ranks as the best light source for near-term MEMS-based projector testing of both flash and scan LADAR seekers.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Lynn Smith "Concepts using optical MEMS array for ladar scene projection", Proc. SPIE 5092, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII, (12 September 2003); doi: 10.1117/12.499175;


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