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16 May 2003 Frequency noise in 850-nm oxidized VCSELs
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Proceedings Volume 5111, Fluctuations and Noise in Photonics and Quantum Optics; (2003) https://doi.org/10.1117/12.500512
Event: SPIE's First International Symposium on Fluctuations and Noise, 2003, Santa Fe, New Mexico, United States
Abstract
The spectral purity of laser radiation is a key point in the performance of coherent optical network. As 850nm VCSELs are being used in short distance interconnections, the evaluation of the frequency noise level is essential. Using a Fabry-Perot cavity as a frequency discriminator, the frequency noise spectrum is being investigated in the medium frequency and high frequency range (up to 1GHz). Frequency noise spectra show a 1/fn part in the medium frequency domain and a traditional white noise part in the high frequency domain. The aim of this paper is to present our measurements concerning 850nm-selectively-oxidized VCSELs and to investigate the different factors which have a quantitative influence on the frequency noise spectrum.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jean-Philippe Tourrenc, Philippe Signoret, Mikhael Myara, Francesco Marin, Kent D. Choquette, and Robert M. Alabedra "Frequency noise in 850-nm oxidized VCSELs", Proc. SPIE 5111, Fluctuations and Noise in Photonics and Quantum Optics, (16 May 2003); https://doi.org/10.1117/12.500512
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