16 May 2003 Low-temperature noise measurements on quantum well infrared photodetectors
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Proceedings Volume 5111, Fluctuations and Noise in Photonics and Quantum Optics; (2003) https://doi.org/10.1117/12.496929
Event: SPIE's First International Symposium on Fluctuations and Noise, 2003, Santa Fe, New Mexico, United States
Abstract
Signal to noise ratio (SNR) is the most important figure of merit for comparing the performance of infrared detectors. When measuring SNR, it is vitally important that all of the noise sources be characterized, including those of the test apparatus. At low temperatures and/or high current, generation-recombination (G-R) noise is expected to be the main noise contributor. At high temperatures and low current, Johnson noise is expected to become comparable to the G-R noise. We present noise measurements under dark conditions on a Quantum Well Infrared Photodetector (QWIP) with careful attention to noise sources present in the measurement apparatus. The noise was dominated by Johnson noise at temperatures <40K, and by G-R noise at 77K and finite bias. A new method to measure noise in QWIPs is described.
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Beverly J Klemme, Beverly J Klemme, Christian C. Morath, Christian C. Morath, Dang T Le, Dang T Le, } "Low-temperature noise measurements on quantum well infrared photodetectors", Proc. SPIE 5111, Fluctuations and Noise in Photonics and Quantum Optics, (16 May 2003); doi: 10.1117/12.496929; https://doi.org/10.1117/12.496929
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