9 May 2003 Electric conduction mechanism in conjugated polymers studied using flicker noise spectroscopy
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Proceedings Volume 5112, Noise as a Tool for Studying Materials; (2003) https://doi.org/10.1117/12.496984
Event: SPIE's First International Symposium on Fluctuations and Noise, 2003, Santa Fe, New Mexico, United States
Spectroscopy of Stochastic Signals (3S) has been used to study conduction behavior in electrochemically deposited conductive polymers (CP) using as example polyaniline and poly(3-methyl thiophene). Within the 3S approach, the conduction process is considered as a stochastic process in heterogeneous disordered system rather than as some classical conduction mechanisms like Schottky or Poole-Frenkel emission. We have been able to distinguish several modes of the conduction process in conducting polymers using the 3S methodology. Particularly, we have established that the transport of charge carriers in highly doped CPs is much less correlated than in non-doped ones, that is, at low doping levels elementary processes involved in the conduction are more correlated than in highly doped polymer. By increasing applied electric field we also achieve lower correlation in a sequence of elementary events contributing to the conductivity of CP. Apparently, the change in the correlation length corresponds to changing mechanism of the electrical conduction. The lower correlation in highly doped sample can be attributed to various factors including change in CP conformation, enhancement in inter-chain charge transfer and generation of polaron lattice. The obtained results show the high informative potential of the 3S method in studying conduction mechanism in conducting polymers.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vitali P. Parkhutik, Vitali P. Parkhutik, Rahul Patil, Rahul Patil, Yutaka Harima, Yutaka Harima, "Electric conduction mechanism in conjugated polymers studied using flicker noise spectroscopy", Proc. SPIE 5112, Noise as a Tool for Studying Materials, (9 May 2003); doi: 10.1117/12.496984; https://doi.org/10.1117/12.496984


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