9 May 2003 Noise in vortex matter
Author Affiliations +
Proceedings Volume 5112, Noise as a Tool for Studying Materials; (2003) https://doi.org/10.1117/12.488747
Event: SPIE's First International Symposium on Fluctuations and Noise, 2003, Santa Fe, New Mexico, United States
The large increase in the flux-flow voltage noise, commonly observed in the vicinity of the peak-effect in superconductors, is ascribed to a novel noise mechanism. The mechanism consists of random injection of the strongly pinned metastable disordered vortex phase through the sample edges and its subsequent random annealing into the weakly pinned ordered phase in the bulk. This results in large critical current fluctuations causing strong vortex velocity fluctuations. The excess noise due to this dynamic admixture of two vortex phases is found to display pronounced reentrant behavior. In the Corbino geometry the injection of the metastable phase is prevented and, accordingly, the excess noise disappears. The excess flux-flow noise in the peak-effect regime is dominated by vortex velocity fluctuations while the density fluctuations, frequently considered in the conventional flux-flow noise models, are negligibly weak. Strong nongaussian fluctuations are associated with S-shaped current-voltage characteristics. The spectral properties of the noise reflect the form of the frequency characteristics of the dynamically coexisting vortex phases which is equivalent to the first order filter response. The cutoff frequency in the spectra corresponds to the time-of-flight of vortices through the disordered part of the sample.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Grzegorz Jung, Grzegorz Jung, Y. Paltiel, Y. Paltiel, E. Zeldov, E. Zeldov, Y. Myasoedov, Y. Myasoedov, M. L. Rappaport, M. L. Rappaport, Miguel Ocio, Miguel Ocio, Shobo Bhattacharya, Shobo Bhattacharya, M. J. Higgins, M. J. Higgins, } "Noise in vortex matter", Proc. SPIE 5112, Noise as a Tool for Studying Materials, (9 May 2003); doi: 10.1117/12.488747; https://doi.org/10.1117/12.488747


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