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12 May 2003 Brief history of recombination noise in semiconductor junction devices
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Proceedings Volume 5113, Noise in Devices and Circuits; (2003) https://doi.org/10.1117/12.497117
Event: SPIE's First International Symposium on Fluctuations and Noise, 2003, Santa Fe, New Mexico, United States
Abstract
This paper reviews the development of the theory and measurement of recombination noise in semiconductor junction devices. It traces this development from van der Ziel's corpuscular models of noise in junction diodes and transistors through to recent models of shot-noise suppression and non-classical light emission from laser and light-emitting diodes due to Yamamoto and co-workers.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Paul J Edwards "Brief history of recombination noise in semiconductor junction devices", Proc. SPIE 5113, Noise in Devices and Circuits, (12 May 2003); https://doi.org/10.1117/12.497117
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