Phase noise metrology and modeling of microwave transistor applications to the design of state-of-the-art dielectric resonator oscillators

Olivier Llopis; Gilles Cibiel

doi:10.1117/12.497467

12 May 2003 Phase noise metrology and modeling of microwave transistor applications to the design of state-of-the-art dielectric resonator oscillators

Olivier Llopis, Gilles Cibiel

Author Affiliations +

Proceedings Volume 5113, Noise in Devices and Circuits; (2003) https://doi.org/10.1117/12.497467
Event: SPIE's First International Symposium on Fluctuations and Noise, 2003, Santa Fe, New Mexico, United States

Abstract

Phase noise in microwave transistors is studied both theoretically and experimentally using residual phase noise measurements. The experimental approach allows the exploration of many interesting features of phase noise generation in these devices, such as the dependence of phase noise versus microwave power or transistor low frequency loading, meanwhile nonlinear simulation is still necessary to optimise the microwave load and the whole oscillator circuit. The different behaviours described are illustrated in various microwave circuits, and particularly dielectric resonator oscillators, with some of them featuring state of the art performance.

Citation Download Citation

Olivier Llopis and Gilles Cibiel "Phase noise metrology and modeling of microwave transistor applications to the design of state-of-the-art dielectric resonator oscillators", Proc. SPIE 5113, Noise in Devices and Circuits, (12 May 2003); https://doi.org/10.1117/12.497467

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