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29 April 2003 Electrical characterization of single-wall carbon nanotubes
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Proceedings Volume 5118, Nanotechnology; (2003)
Event: Microtechnologies for the New Millennium 2003, 2003, Maspalomas, Gran Canaria, Canary Islands, Spain
Single Wall Carbon Nanotubes (SWCNTs) based nanotechnology appears to be promising for future nanoelectronics. The SWCNT may be either metallic or semiconducting and both metallic and semiconducting types of SWCNTs have been observed experimentally. This gives rise to intriguing possibilities to put together semiconductor-semiconductor and semiconductor-metal junctions for diodes and transistors. The potential for nanotubes in nanoelectronics devices, displays and nanosensors is enormous. However, in order to realize the potential of SWCNTs, it is critical to understand the properties of charge transport and to control phase purity, elicity and arrangement according to specific architectures. We have investigated the electrical properties of various SWCNTs samples whit different organization: bundles of SWCNTs, SWCNT fibres and different membranes and tablets obtained using SWCNTs purified and characterized. Electrical characterizations were carried out by a 4155B Agilent Semiconductor Parameter Analyser. In order to give a mechanical stability to SWCNTs fibres and bundles we have used a nafion matrix coating, so an electrical characterization has been performed on samples with and without this layer. I-V measurements were performed in vacuum and in air using aluminium interdigitated coplanar-electrodes (width=20mm or 40mm) on glass substrates. The behaviour observed is generally supralinear with currents of the order of mA in vacuum and lower values in air with the exception of the tablet samples where the behaviour is ohmic, the currents are higher and similar values of current are detected in air and vacuum.
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Marco Berliocchi, Francesca Brunetti, Aldo Di Carlo, Paolo Lugli, Silvia Orlanducci, and Maria Letizia Terranova "Electrical characterization of single-wall carbon nanotubes", Proc. SPIE 5118, Nanotechnology, (29 April 2003);

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