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29 April 2003 Second-harmonic far-field microscopy of random metal nanostructures
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Abstract
Using a scanning far-field second harmonic (SH) microscope we have excited surface plasmon polaritons (SPPs) on a 70 nm thick gold film surface covered with randomly distributed 80 nm wide gold particles. Multiple scattering of the SPPs by these gold particles leads to localization of the electromagnetic fields causing strongly enhanced and spatially localized SH generation. We investigate wavelength and polarization dependencies of both position and intensity of these SH bright spots for two different densities of random scatterers. Comparing SH and fundamental harmonic (FH) images, we conclude that the localized SH enhancement occurs due to overlap of FH and SH eigenmodes. Furthermore we confirm that for incident laser powers in the range 3-40mW, the bright spots exhibit quadratic intensity dependence. For the higher incident laser powers however, the strong heating of the surface seems to change the material properties causing some bright spots to disappear and others to emerge.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jonas Beermann, Sergey I. Bozhevolnyi, and Victor Coello "Second-harmonic far-field microscopy of random metal nanostructures", Proc. SPIE 5118, Nanotechnology, (29 April 2003); https://doi.org/10.1117/12.498747
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