10 November 2003 Characteristics of high-reflection thin films in a COIL system
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Proceedings Volume 5120, XIV International Symposium on Gas Flow, Chemical Lasers, and High-Power Lasers; (2003) https://doi.org/10.1117/12.515581
Event: XIV International Symposium on Gas Flow, Chemical Lasers, and High-Power Lasers, 2002, Wroclow, Poland
Abstract
Several kinds of high reflection thin films are prepared by electron beam gun with different designs and coating materials. The reflectivity, transmission, absorption and scattering of these thin films are measured and calculated, the loss of absorption and scattering of the thin films are mainly discussed. Furthermore, the absorption of films are also analyzed under different annealing temperature, it is found that the absorption loss can be dramatically reduced after annealing. At the same time, the compositions of thin films are tested by AES (Auger electron spectroscopy) to detect whether there is impurity or contamination.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
YingJian Wang, YongHao Jin, ZhengXiu Fan, JianDa Shao, "Characteristics of high-reflection thin films in a COIL system", Proc. SPIE 5120, XIV International Symposium on Gas Flow, Chemical Lasers, and High-Power Lasers, (10 November 2003); doi: 10.1117/12.515581; https://doi.org/10.1117/12.515581
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