8 August 2003 Glass-like behavior in relaxor ferroelectric thin films
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Proceedings Volume 5122, Advanced Organic and Inorganic Optical Materials; (2003) https://doi.org/10.1117/12.515665
Event: 2003 Chapter books, 2003, Bellingham, WA, United States
Dielectric properties of epitaxial heterostructures of perovskite relaxor ferroelectric (RFE) PbMg1/3Nb2/3O3, PbSc0.5Nb0.5O3, PbMg1/3Nb2/3O3-PbTiO3, and PbSc0.5Nb0.5O3-PbTiO3 thin films were studied as a function of frequency (102 - 106 Hz), temperature (77 - 725 K), and amplitude of applied ac-field (103 - 106 V/m). The contribution of the film-electrode interfaces to the properties of the heterostructures was evaluated, and the true properties of the films were reconstructed and analyzed. In the films, all typical features of RFE were found to be essentially similar to those in single crystals. Glass-like behavior in the RFE films was indicated by the Vogel-Fulcher relationship, deviation from the Curie-Weiss behavior, temperature evolution of the local order parameter, temperature evolution of the relaxation-time spectrum, and the maxima in the third-order nonlinear and scaled third-order nonlinear dielectric permittivities below the temperature of the dielectric maximum.
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M. Tyunina, M. Tyunina, Juhani Levoska, Juhani Levoska, } "Glass-like behavior in relaxor ferroelectric thin films", Proc. SPIE 5122, Advanced Organic and Inorganic Optical Materials, (8 August 2003); doi: 10.1117/12.515665; https://doi.org/10.1117/12.515665

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