8 August 2003 Iridium L3-edge and oxygen K-edge x-ray absorption spectroscopy of nanocrystalline iridium oxide thin films
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Abstract
Structural investigations of the short range order around iridium and oxygen ions in nanocrystalline iridium oxide thin films, prepared by dc magnetron sputtering technique, were performed by x-ray absorption spectroscopy. The Ir L3-edge extended x-ray absorption fine structure and the O K-edge x-ray absorption near edge structure signals were measured at room temperature and analyzed within ab initio multiple-scattering and full-multiple-scattering approaches, respectively. The x-ray absorption spectroscopy results indicate the presence in the films of orderd regions - nanocrystals, having a size of about 10 angstrom and a structure rather close to that in crystalline iridium oxide IrO2. Such evidence agrees well with observations by x-ray diffraction, suggesting that the thin films are x-ray amorphous.
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A. Kuzmin, A. Kuzmin, R. Kalendarev, R. Kalendarev, J. Purans, J. Purans, D. Pailharey, D. Pailharey, } "Iridium L3-edge and oxygen K-edge x-ray absorption spectroscopy of nanocrystalline iridium oxide thin films", Proc. SPIE 5123, Advanced Optical Devices, Technologies, and Medical Applications, (8 August 2003); doi: 10.1117/12.517024; https://doi.org/10.1117/12.517024
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