Paper
24 October 2003 Multichannel boundary scan controller
Wojciech M. Zabolotny, Seweryn Jodlowski, Michal Pietrusinski, Krzysztof T. Pozniak, Ignacy Maciej Kudla
Author Affiliations +
Proceedings Volume 5125, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments; (2003) https://doi.org/10.1117/12.531564
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2002, 2002, Wilga, Poland
Abstract
The paper presents, a specially designed chip, which ensures the carrying out of tests compliant with IEEE 1149.1-1990 Std. The above mentioned tests are very useful when checking for any errors and defects in electronics devices. The currently available solutions are not suitable for the requirements, which are quite specific and are the results of past experience. Therefore, a dedicated Field Programmable Gate Array (FPGA) core was created in VLSI Hardware Description Language (VHDL) implementing the desired functionality. The achieved result is a BS controller supporting many BS chains, working in parallel and using pipelining to boost performance.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wojciech M. Zabolotny, Seweryn Jodlowski, Michal Pietrusinski, Krzysztof T. Pozniak, and Ignacy Maciej Kudla "Multichannel boundary scan controller", Proc. SPIE 5125, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments, (24 October 2003); https://doi.org/10.1117/12.531564
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KEYWORDS
Boundary scan

Field programmable gate arrays

Electronics

Curium

Device simulation

Electronic components

Muons

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