10 October 2003 Changes in the temperature dependence of the dielectric constant in irradiated antiferroelectric thin films
Author Affiliations +
Proceedings Volume 5127, Sixth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering; (2003) https://doi.org/10.1117/12.517954
Event: Sixth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, 2002, St. Petersburg, Russian Federation
Abstract
A model describing the changes of the Curie-Weiss temperature in lead-zirconate thin films under neutron irradiation is proposed. The Curie-Weiss temperature in the irradiated material decreases which is connected to charges caused by neutron irradiation. The charges located near the surfaces due to Schottky effect and in the bulk of the film results in different rates of the Curie-Weiss temperature decreases with neutron fluence. However the influence of the Schottky layers seems to be more pronounced. Satisfactory agreement between the theoretical results and the experimental data is obtained for different neutron fluences.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dmitry A. Lesnyh, Dmitry A. Lesnyh, Dmitry V. Kulikov, Dmitry V. Kulikov, Yuri V. Trushin, Yuri V. Trushin, Roland Bittner, Roland Bittner, Karl Humer, Karl Humer, Harald W. Weber, Harald W. Weber, Andris R. Sternberg, Andris R. Sternberg, } "Changes in the temperature dependence of the dielectric constant in irradiated antiferroelectric thin films", Proc. SPIE 5127, Sixth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (10 October 2003); doi: 10.1117/12.517954; https://doi.org/10.1117/12.517954
PROCEEDINGS
4 PAGES


SHARE
Back to Top