Paper
10 October 2003 Influence of the growth temperature on SiC nanocluster nucleation on Si(111) surface during MBE process
Kirill L. Safonov, Dmitri V. Kulikov, Yuri V. Trushin, Joerg Pezoldt
Author Affiliations +
Proceedings Volume 5127, Sixth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering; (2003) https://doi.org/10.1117/12.517950
Event: Sixth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, 2002, St. Petersburg, Russian Federation
Abstract
Rate equations approach of computer simulation has been applied to investigate the SiC clusters nucleation and growth on Si surface during molecular beam epitaxy. Cluster surface densities have been obtained for a range of temperatures. The temperature influence on the consequent clusters density, including the surface phase transition (which occurs with simultaneous structure reconstruction), has been determined. The results obtained by the application of the suggested physical model have appeared to be in the reasonable agreement with experimental data.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kirill L. Safonov, Dmitri V. Kulikov, Yuri V. Trushin, and Joerg Pezoldt "Influence of the growth temperature on SiC nanocluster nucleation on Si(111) surface during MBE process", Proc. SPIE 5127, Sixth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (10 October 2003); https://doi.org/10.1117/12.517950
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KEYWORDS
Silicon carbide

Chemical species

Silicon

Carbon

Molecules

Diffusion

Data modeling

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