Accurate absolute frequency measurements across the optical spectrum using a single ion

Alan A. Madej; J. E. Bernard; A. Czajkowski; P. Dube; L. Marmet; K. J. Siemsen; R. S. Windeler

doi:10.1117/12.518136

6 October 2003 Accurate absolute frequency measurements across the optical spectrum using a single ion

Alan A. Madej, J. E. Bernard, A. Czajkowski, P. Dube, L. Marmet, K. J. Siemsen, R. S. Windeler

Proceedings Volume 5137, International Conference on Lasers, Applications, and Technologies 2002: Advanced Lasers and Systems; (2003) https://doi.org/10.1117/12.518136
Event: International Conference on Lasers, Applications, and Technologies 2002, 2002, Moscow, Russian Federation

Abstract

A 445-THz (674nm), ⁸⁸Sr⁺ trapped and laser cooled single ion reference transition has been used at the National Research Council of Canada (NRC) to extend precision frequency measurements to other points in the electromagnetic (EM) spectrum. We are currently refining the single ion experiment to approach the uncertainty limited spectral resolution of 1×10^-15. Connected with these developments is the use of frequency grids based on mode-locked femtosecond lasers. A band of reference modes extending from 520 nm to beyond 1060 nm has been recently obtained femtosecond lasers. A band of reference modes extending from 520 nm to beyond 1060 nm has been recently obtained at NRC and has been applied to the absolute frequency measurement of the widely used 633 nm I₂ stabilized HeNe laser standard. Excellent agreement was obtained between the measurements determiend via ion an comb based measurements. With such devices, the possibility of accurate, stable and compact sources at any wavelength is coming into being.

Citation Download Citation

Alan A. Madej, J. E. Bernard, A. Czajkowski, P. Dube, L. Marmet, K. J. Siemsen, and R. S. Windeler "Accurate absolute frequency measurements across the optical spectrum using a single ion", Proc. SPIE 5137, International Conference on Lasers, Applications, and Technologies 2002: Advanced Lasers and Systems, (6 October 2003); https://doi.org/10.1117/12.518136

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