Paper
15 October 2003 Rigorous characterization of time-resolved diffuse spectroscopy systems for measurements of absorption and scattering properties using solid phantoms
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Abstract
Two systems for measurements of absorption and scattering properties, based on picosecond-pulse lasers and singlephoton counting detection, were characterized using a detailed protocol. The first system utilizes diode lasers at 660, 785, 910 and 974 nm as light sources. The second employs a Ti:sapphire and a mode-locked dye laser to produce tunable pulses in the range 610 - 1000 nm. Using solid tissue phantoms, the systems were rigorously characterized and compared in terms of absolute accuracy of the measured scattering and absorption coefficients, the linearity over the parameter range, the precision with respect to injected light energy, the stability over time, and the reproducibility of the results. The phantoms were made of epoxy resin with TiO as scatterer and black toner powder as absorber.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Johannes Swartling, Antonio Pifferi, Eleonora Giambattistelli, Ekaterine Chikoidze, Alessandro Torricelli, Paola Taroni, Magnus Andersson, Anders Nilsson, and Stefan Andersson-Engels "Rigorous characterization of time-resolved diffuse spectroscopy systems for measurements of absorption and scattering properties using solid phantoms", Proc. SPIE 5138, Photon Migration and Diffuse-Light Imaging, (15 October 2003); https://doi.org/10.1117/12.500580
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Cited by 3 scholarly publications and 3 patents.
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KEYWORDS
Absorption

Scattering

Spectroscopy

Laser scattering

Semiconductor lasers

Laser systems engineering

Solids

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