Sampling function in en-face OCT

Iwona Gorczynska; Adrian Gh. Podoleanu; Radu G. Cucu; David A. Jackson

doi:10.1117/12.500311

2 October 2003 Sampling function in en-face OCT

Iwona Gorczynska, Adrian Gh. Podoleanu, Radu G. Cucu, David A. Jackson

Proceedings Volume 5140, Optical Coherence Tomography and Coherence Techniques; (2003) https://doi.org/10.1117/12.500311
Event: European Conferences on Biomedical Optics 2003, 2003, Munich, Germany

Abstract

En-face OCT relies on scanning fast along a direction perpendicular to the optical axis. C-scan images (en-face slices at constant depth) can be obtained at different depths. The quality of the image and what part of a particular layer is visible depends on the properties of the sampling function. In this paper we examine how the scanning configuration, the interface optics, the coherence length of the source used, and the object itself influence the shape of the sampling function.

Citation Download Citation

Iwona Gorczynska, Adrian Gh. Podoleanu, Radu G. Cucu, and David A. Jackson "Sampling function in en-face OCT", Proc. SPIE 5140, Optical Coherence Tomography and Coherence Techniques, (2 October 2003); https://doi.org/10.1117/12.500311

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