30 May 2003 Applications of inverse pattern projection
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Abstract
Fast and robust 3D quality control as well as fast deformation measurement is of particular importance for industrial inspection. Additionally a direct response about measured properties is desired. Therefore, robust optical techniques are needed which use as few images as possible for measurement and visualize results in an efficient way. One promising technique for this aim is the inverse pattern projection which has the following advantages: The technique codes the information of a preceding measurement into the projected inverse pattern. Thus, it is possible to do differential measurements using only one camera frame for each state. Additionally, the results are optimized straight fringes for sampling which are independent of the object curvature. The hardware needs are low as just a programmable projector and a standard camera are necessary. The basic idea of inverse pattern projection, necessary algorithms and found optimizations are demonstrated, roughly. Evaluation techniques were found to preserve a high quality phase measurement under imperfect conditions. The different application fields can be sorted out by the type of pattern used for inverse projection. We select two main topics for presentation. One is the incremental (one image per state) deformation measurement which is a promising technique for high speed deformation measurements. A video series of a wavering flag with projected inverse pattern was evaluated to show the complete deformation series. The other application is the optical feature marking (augmented reality) that allows to map any measured result directly onto the object under investigation. Any properties can be visualized directly on the object’s surface which makes inspections easier than with use of a separated indicating device. The general ability to straighten any kind of information on 3D surfaces is shown while preserving an exact mapping of camera image and object parts. In many cases this supersedes an additional monitor to view results and allows an operator to investigate results on the object, directly.
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Wansong Li, Wansong Li, Thorsten Bothe, Thorsten Bothe, Michael K. Kalms, Michael K. Kalms, Christoph von Kopylow, Christoph von Kopylow, Werner P. O. Jueptner, Werner P. O. Jueptner, } "Applications of inverse pattern projection", Proc. SPIE 5144, Optical Measurement Systems for Industrial Inspection III, (30 May 2003); doi: 10.1117/12.508367; https://doi.org/10.1117/12.508367
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