Paper
30 May 2003 Influence of change of imaging conditions on accuracy of optical measurement systems in industry
Author Affiliations +
Abstract
Our work analyzes an influence of the change of imaging conditions on the accuracy of optical and optoelectronic measurement systems, which are used in various industrial branches, e.g. in mechanical engineering, optical industry, building industry, etc. It is shown that in case of the change of position of the measured object the imaging properties of the used optical measurement instrument are changed. This position change affects the image quality. If some optical measurement system is aberration free for a specified position of the measured object, then for other object positions the optical system has aberrations. The consequence of this effect is the change of the measurement accuracy for the specific optical system. The described effect is not removable on principle and it is necessary to take account to it in high accuracy measurements.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Antonin Miks and Jiri Novak "Influence of change of imaging conditions on accuracy of optical measurement systems in industry", Proc. SPIE 5144, Optical Measurement Systems for Industrial Inspection III, (30 May 2003); https://doi.org/10.1117/12.499583
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Imaging systems

Optical testing

Image quality

Monochromatic aberrations

Distance measurement

Manufacturing

Mechanical engineering

Back to Top