Translator Disclaimer
Paper
14 November 2003 Femtosecond x-ray diagnostic
Author Affiliations +
Proceedings Volume 5147, ALT'02 International Conference on Advanced Laser Technologies; (2003) https://doi.org/10.1117/12.537507
Event: ALT'02 International Conference on Advanced laser Technologies, 2002, Adelboden, Switzerland
Abstract
In this paper we discuss some result achieved at Laboratoire d'Optique Appliquee that may improve the capabilities of the laser-produced plasma x-ray source for applications in the study of ultrafast transient structures.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Davide Boschetto, Christian Rischel, Olivier Albert, Jean Etchepare, Ingo Uschmann, S. Fourmaux, Daniele Hulin, Eckhart Forster, and Antoine Rousse "Femtosecond x-ray diagnostic", Proc. SPIE 5147, ALT'02 International Conference on Advanced Laser Technologies, (14 November 2003); https://doi.org/10.1117/12.537507
PROCEEDINGS
6 PAGES


SHARE
Advertisement
Advertisement
Back to Top