Paper
12 January 2004 Noise sources and noise suppression in CMOS imagers
Bedabrata Pain, Thomas J. Cunningham, Bruce R. Hancock
Author Affiliations +
Abstract
Mechanisms for noise coupling in CMOS imagers are complex, since unlike a CCD, a CMOS imager has to be considered as a full digital-system-on-a-chip, with a highly sensitive front-end. In this paper, we analyze the noise sources in a photodiode CMOS imager, and model their propagation through the signal chain to determine the nature and magnitude of noise coupling. We present methods for reduction of noise, and present measured data to show their viability. For temporal read noise reduction, we present pixel signal chain design techniques to achieve near 2 electrons read noise. We model the front-end reset noise both for conventional photodiode and CTIA type of pixels. For the suppression of reset noise, we present a column feedback-reset method to reduce reset noise below 6 electrons. For spatial noise reduction, we present the design of column signal chain that suppresses both spatial noise and power supply coupling noise. We conclude by identifying problems in low-noise design caused by dark current spatial distribution.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Bedabrata Pain, Thomas J. Cunningham, and Bruce R. Hancock "Noise sources and noise suppression in CMOS imagers", Proc. SPIE 5167, Focal Plane Arrays for Space Telescopes, (12 January 2004); https://doi.org/10.1117/12.512281
Lens.org Logo
CITATIONS
Cited by 7 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Interference (communication)

Imaging systems

Capacitance

Photodiodes

Power supplies

Denoising

Electrons

RELATED CONTENT

Figure-of-merit for CMOS imagers
Proceedings of SPIE (April 24 2002)
Featuring in CCD imagers
Proceedings of SPIE (April 21 2006)
CMOS active pixel image sensor with CCD performance
Proceedings of SPIE (September 07 1998)
Noise analysis of a fully integrated CMOS image sensor
Proceedings of SPIE (March 22 1999)

Back to Top