Optical constants for hard x-ray multilayers over the energy range E = 35 – 180 keV

David L. Windt; Soizik Donguy; Charles J. Hailey; Jason E. Koglin; Veijo Honkimaki; Eric Ziegler; Finn E. Christensen; Fiona A. Harrison

doi:10.1117/12.505886

29 January 2004 Optical constants for hard x-ray multilayers over the energy range E = 35 - 180 keV

David L. Windt, Soizik Donguy, Charles J. Hailey, Jason E. Koglin, Veijo Honkimaki, Eric Ziegler, Finn E. Christensen, Fiona A. Harrison

Author Affiliations +

Proceedings Volume 5168, Optics for EUV, X-Ray, and Gamma-Ray Astronomy; (2004) https://doi.org/10.1117/12.505886
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

We have determined experimentally optical constants for eight thin film materials that can be used in hard X-ray multilayer coatings. Thin film samples of Ni_.97V_.03, Mo, W, Pt, C, B₄C, Si and SiC were deposited by magnetron sputtering onto superpolished optical flats. Optical constants were determined from fits to reflectance-vs-incidence angle measurements made using synchrotron radiation over the energy range E=35-180 keV. We have also measured the X-ray reflectance of a prototype W/SiC multilayer coating over the energy range E=35-100 keV, and we compare the measured reflectance with a calculation using the newly derived optical constants.

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David L. Windt, Soizik Donguy, Charles J. Hailey, Jason E. Koglin, Veijo Honkimaki, Eric Ziegler, Finn E. Christensen, and Fiona A. Harrison "Optical constants for hard x-ray multilayers over the energy range E = 35 - 180 keV", Proc. SPIE 5168, Optics for EUV, X-Ray, and Gamma-Ray Astronomy, (29 January 2004); https://doi.org/10.1117/12.505886

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