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6 November 2003 Advances in polarization metrology
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Abstract
Three new polarimeters are described which represent advances in polarization metrology capabilities. Two are at a new polarization laboratory started at the University of Arizona’s Optical Sciences Center, (1) a Fiber Optic Spectropolarimeter and (2) a High Speed Mueller Matrix Imaging Polarimeter. The third is a new visible Mueller Matrix Spectropolarimeter for optical component test from a startup company, Axometrics, which is useful for detailed characterization of optical components and thin films via spectra of diattenuation, retardance, and depolarization.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Russell A. Chipman "Advances in polarization metrology", Proc. SPIE 5174, Novel Optical Systems Design and Optimization VI, (6 November 2003); https://doi.org/10.1117/12.511279
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