10 November 2003 Terahertz-regime realization and optical characterization of two-dimensional photonic crystal waveguides on a silicon-on-insulator (SOI) substrate
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Abstract
A terahertz-scale two-dimensional photonic-crystal waveguide based on a silicon-on-insulator was fabricated, and the optical transmission spectrum was measured. Terahertz beam propagation characteristics were observed using a thermal imaging camera, with incident light in the 10.1-10.7μm range. The measured transmission spectrum was in very good agreement with a three-dimensional finite-difference time-domain calculation.
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Chunchen Lin, Caihua Chen, Garrett J. Schneider, Peng Yao, Shouyuan Shi, Ahmed Sharkawy, Dennis W. Prather, "Terahertz-regime realization and optical characterization of two-dimensional photonic crystal waveguides on a silicon-on-insulator (SOI) substrate", Proc. SPIE 5181, Wave Optics and Photonic Devices for Optical Information Processing II, (10 November 2003); doi: 10.1117/12.507762; https://doi.org/10.1117/12.507762
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