Point spread function engineering in confocal scanning microscopy

Manuel Martinez-Corral

doi:10.1117/12.510209

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31 December 2003 Point spread function engineering in confocal scanning microscopy

Manuel Martinez-Corral

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Proceedings Volume 5182, Wave-Optical Systems Engineering II; (2003) https://doi.org/10.1117/12.510209
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

Confocal scanning microscopes are imaging systems that are mainly featured by their unique depth-discrimination capacity when imaging three-dimensional objects. Along the past few years, our research group has done several attempts to improve their axial resolution by means of the so-called point-spread-function (PSF) engineering method. That is, by designing diffractive elements that properly shape the PSF. Our PSF engineering techniques have been designed to work in the nonparaxial regime and are applied both to bright-field and single-photon fluorescence confocal microscopy, and also to more elaborated architectures like 4Pi confocal microscopy.

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Manuel Martinez-Corral "Point spread function engineering in confocal scanning microscopy", Proc. SPIE 5182, Wave-Optical Systems Engineering II, (31 December 2003); https://doi.org/10.1117/12.510209

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