Enhancement and quenching of the fluorescence of single CdSe/ZnS quantum dots studied by confocal apertureless near-field scanning optical microscope

Vladimir V. Protasenko; Alan Gallagher; Massimiliano Labardi; David J. Nesbitt

doi:10.1117/12.504880

4 November 2003 Enhancement and quenching of the fluorescence of single CdSe/ZnS quantum dots studied by confocal apertureless near-field scanning optical microscope

Vladimir V. Protasenko, Alan Gallagher, Massimiliano Labardi, David J. Nesbitt

Author Affiliations +

Proceedings Volume 5188, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies; (2003) https://doi.org/10.1117/12.504880
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

We have studied the influence of Si atomic force microscope (AFM) probes on fluorescence of ZnS overcoated CdSe quantum dots (QDs) in an apertureless near-field scanning optical microscope (ANSOM). In these ANSOM measurements, the excitation light polarization and probe preparation procedure strongly affect the QD fluorescence. When the excitation light polarization is orthogonal to the probe axis (and parallel to the substrate surface), we detect 50 to 80% fluorescence quenching, with a HF-etched Si probe scanning ~10 nm above the sample. With polarization of the excitation collinear with the probe axis, the optical field is amplified many times in the near-field zone, and the net result is a 2-4 times fluorescence enhancement. In this work we utilize a home-built, non-contact AFM and confocal ANSOM microscope under total internal reflection of Ar⁺ laser beam excitation.

Citation Download Citation

Vladimir V. Protasenko, Alan Gallagher, Massimiliano Labardi, and David J. Nesbitt "Enhancement and quenching of the fluorescence of single CdSe/ZnS quantum dots studied by confocal apertureless near-field scanning optical microscope", Proc. SPIE 5188, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies, (4 November 2003); https://doi.org/10.1117/12.504880

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available