Optical characterization in wide spectral range by a coherent spectrophotometer

Valdas Sirutkaitis; Robert C. Eckardt; Ona Balachninaite; Rimantas Grigonis; A. Melninkaitis; T. Rakickas

doi:10.1117/12.508642

4 November 2003 Optical characterization in wide spectral range by a coherent spectrophotometer

Valdas Sirutkaitis, Robert C. Eckardt, Ona Balachninaite, Rimantas Grigonis, A. Melninkaitis, T. Rakickas

Author Affiliations +

Proceedings Volume 5188, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies; (2003) https://doi.org/10.1117/12.508642
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

We report on the development and use of coherent spectrophotometers specialized for the unusual requirements of characterizing nonlinear optical materials and multilayer dielectric coatings used in laser systems. A large dynamic range is required to measure the linear properties of transmission, reflection and absorption and nonlinear properties of laser-induced damage threshold and nonlinear frequency conversion. Optical parametric oscillators generate coherent radiation that is widely tunable with instantaneous powers that can range from milliwatts to megawatts and are well matched to this application. As particular example a laser spectrophotometer based on optical parametric oscillators and a diode-pumped, Q-switched Nd:YAG laser and suitable for optical characterization in the spectral range 420-4500 nm is described. Measurements include reflectance and transmittance, absorption, scattering and laser-induced damage thresholds. Possibilities of a system based on a 130-fs Ti:sapphire laser and optical parametric generators are also discussed.

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Valdas Sirutkaitis, Valdas Sirutkaitis, Robert C. Eckardt, Robert C. Eckardt, Ona Balachninaite, Ona Balachninaite, Rimantas Grigonis, Rimantas Grigonis, A. Melninkaitis, A. Melninkaitis, T. Rakickas, T. Rakickas, } "Optical characterization in wide spectral range by a coherent spectrophotometer", Proc. SPIE 5188, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies, (4 November 2003); doi: 10.1117/12.508642; https://doi.org/10.1117/12.508642

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