16 October 2003 Reflection and transmission scattering by rough plane surface of glass hemisphere
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Abstract
Polarization of both Reflection and transmission scatterings by a rough plane surface of a glass hemisphere with a smooth spherical surface were measured. Null ellipsometry was used to measure the ellipsometric parameters and depolarization. Linear polarization, circular polarization, and principal Mueller matrix were obtained from the above measured quantities. Scattering was measured at fixed incident and detection directions, and variable sample orientation. The scattering and its polarization and depolarization are symmetric with the off-specular angle (OSA). The measured linear polarization increases with increasing OSA, and may change sign for large OSA. Reflection scattering shows more depolarization than the transmission scattering and so do the deviations from the specular values for all parameters.
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Soe-Mie F. Nee, Soe-Mie F. Nee, Tsu-Wei Nee, Tsu-Wei Nee, } "Reflection and transmission scattering by rough plane surface of glass hemisphere", Proc. SPIE 5189, Surface Scattering and Diffraction III, (16 October 2003); doi: 10.1117/12.507780; https://doi.org/10.1117/12.507780
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