Paper
20 November 2003 Recent activities at PTB nanometer comparator
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Abstract
The PTB in cooperation with the Dr. Johannes Heidenhain GmbH built up a new length comparator with a measurement range of 610 mm for 1D length measurements on line scales, linear encoders and interferometers. The PTB nanometer comparator was retrofitted and now allows a stable operation of the interferometer. To investigate the actual measurement performance a few line scales and a linear encoder were measured and compared with results from other comparators. The results are discussed and recent developments at the nanometer comparator are described.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jens Flugge, Rainer Koning, and Harald Bosse "Recent activities at PTB nanometer comparator", Proc. SPIE 5190, Recent Developments in Traceable Dimensional Measurements II, (20 November 2003); https://doi.org/10.1117/12.506908
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Cited by 12 scholarly publications.
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KEYWORDS
Interferometers

Computer programming

Optical fibers

Microscopes

Optical microscopes

Calibration

Head

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