14 November 2003 The design of the new NPL reference spectrofluorimeter
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Abstract
To meet demands for increased traceability of fluorescence measurement a new two-monochromator reference spectrofluorimeter has been designed and built at NPL. This new instrument is capable of measuring the radiance factor and associated colorimetry of solid and liquid fluorescent materials at virtually any angle to the incident light beam. A 1 kW xenon light source and the use of reflective optics enable the device to make bispectral measurements from the ultraviolet to the near infrared. This paper describes the optical arrangement of the new system..
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Michael J. Shaw, Peter J. Clarke, Timothy A. Burnitt, "The design of the new NPL reference spectrofluorimeter", Proc. SPIE 5192, Optical Diagnostic Methods for Inorganic Materials III, (14 November 2003); doi: 10.1117/12.509181; https://doi.org/10.1117/12.509181
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KEYWORDS
Mirrors

Luminescence

Off axis mirrors

Nanolithography

Sensors

Reflectivity

Spectrographs

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