Characterization of CsI photocathodes at grazing incidence for use in a unit quantum efficiency x-ray streak camera

Donnacha P. Lowney; Philip A. Heimann; Eric M. Gullikson; Andrew G. MacPhee; Roger W. Falcone; Howard A. Padmore

doi:10.1117/12.503412

28 January 2004 Characterization of CsI photocathodes at grazing incidence for use in a unit quantum efficiency x-ray streak camera

Donnacha P. Lowney, Philip A. Heimann, Eric M. Gullikson, Andrew G. MacPhee, Roger W. Falcone, Howard A. Padmore

Author Affiliations +

Proceedings Volume 5194, Fourth-Generation X-Ray Sources and Ultrafast X-Ray Detectors; (2004) https://doi.org/10.1117/12.503412
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

The performance of CsI photocathodes has been characterized for use with grazing incidence soft x-rays. The total electron yield and pulsed quantum efficiency from a CsI photocathode has been measured in a reflection geometry as a function of photon energy (100 eV to 1 keV), angle of incidence and the electric field between the anode and photocathode. The total electron yield and pulsed quantum efficiency increase as the x-ray penetration depth approaches the secondary electron escape depth. Unit quantum efficiency in a grazing incidence geometry is demonstrated. A weak electric field dependence is observed for the total yield measurements; whilst no significant dependence is found for the pulsed quantum efficiency. Theoretical predictions agree accurately with experiment.

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Donnacha P. Lowney, Philip A. Heimann, Eric M. Gullikson, Andrew G. MacPhee, Roger W. Falcone, and Howard A. Padmore "Characterization of CsI photocathodes at grazing incidence for use in a unit quantum efficiency x-ray streak camera", Proc. SPIE 5194, Fourth-Generation X-Ray Sources and Ultrafast X-Ray Detectors, (28 January 2004); https://doi.org/10.1117/12.503412

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