23 December 2003 High selective x-ray multilayers
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Two approaches have been explored to cover existing gap in energy resolution between traditional multilayers (1 to 2%) and perfect crystals (0.01%). The first approach is based on low contrast (Al2O3/B4C) multilayers where we measured the width of the reflectivity curve as low as 17 arc sec, a spectral resolution of 0.27% and a reflectivity of 40% from a 26 Å d-spacing multilayer with 800 bi-layers. The second approach is based on using structures with small d-spacing using traditional W/B4C and Mo/B4C materials. A W/B4C multilayer with 14.8Å d-spacing showed a resolution of 0.5% and a reflectivity of 58.5%. Two Mo/B4C samples with d-spacings of 15Å and 20Å showed energy resolutions of 0.25% and 0.52% with corresponding reflectivities of 39% and 66% correspondingly.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vladimir V. Martynov, Vladimir V. Martynov, Yuriy Platonov, Yuriy Platonov, Alexander Kazimirov, Alexander Kazimirov, Donald H. Bilderback, Donald H. Bilderback, } "High selective x-ray multilayers", Proc. SPIE 5195, Crystals, Multilayers, and Other Synchrotron Optics, (23 December 2003); doi: 10.1117/12.502709; https://doi.org/10.1117/12.502709


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