23 December 2003 High selective x-ray multilayers
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Abstract
Two approaches have been explored to cover existing gap in energy resolution between traditional multilayers (1 to 2%) and perfect crystals (0.01%). The first approach is based on low contrast (Al2O3/B4C) multilayers where we measured the width of the reflectivity curve as low as 17 arc sec, a spectral resolution of 0.27% and a reflectivity of 40% from a 26 Å d-spacing multilayer with 800 bi-layers. The second approach is based on using structures with small d-spacing using traditional W/B4C and Mo/B4C materials. A W/B4C multilayer with 14.8Å d-spacing showed a resolution of 0.5% and a reflectivity of 58.5%. Two Mo/B4C samples with d-spacings of 15Å and 20Å showed energy resolutions of 0.25% and 0.52% with corresponding reflectivities of 39% and 66% correspondingly.
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Vladimir V. Martynov, Vladimir V. Martynov, Yuriy Platonov, Yuriy Platonov, Alexander Kazimirov, Alexander Kazimirov, Donald H. Bilderback, Donald H. Bilderback, } "High selective x-ray multilayers", Proc. SPIE 5195, Crystals, Multilayers, and Other Synchrotron Optics, (23 December 2003); doi: 10.1117/12.502709; https://doi.org/10.1117/12.502709
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