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23 December 2003 Spatially resolved tilt and strain measurements in diamond crystals
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Abstract
X-ray diffraction imaging with micrometer resolution was performed on type Ib and IIa diamond crystals. Experiments were carried out using 8 keV x-rays and a double-crystal diffractometer equipped with a CCD detector (pixel size 60 μm x 60 μm). Diamond samples were rotated about the horizontal axis collinear with a given reciprocal lattice vector. Local rocking curves (LRCs) were extracted from sequences of topographs taken at various angles along the global rocking curves measured at different azimuth positions of the specimen. Based on the angular positions of these LRCs, maps of local tilt and strain were produced. Results demonstrate that local misorientations play a more important role than do lattice parameter variations in broadening of total crystal rocking curves.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Szczesny B. Krasnicki, Yuncheng Zhong, Jozef Maj, and Albert T. Macrander "Spatially resolved tilt and strain measurements in diamond crystals", Proc. SPIE 5195, Crystals, Multilayers, and Other Synchrotron Optics, (23 December 2003); https://doi.org/10.1117/12.516621
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