23 December 2003 Two-dimensional asymmetrical Bragg diffraction for submicrometer computer tomography
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Abstract
With the advent of high brilliance, third generation synchrotron radiation sources, the spatial resolution of non-destructive X-ray tomographic investigations can be scaled down to the micrometer or even submicrometer range while the coherent nature of the radiation extends the traditional absorption imaging techniques towards edge-enhanced or phase-sensitive measurements. The performance of the presently used detectors is limited by scintillation properties, optical light coupling and charge coupled device granularity which impose a practical limit of about 1 micrometer spatial resolution with efficiencies of a few percent. We developed a detector called Bragg magnifier which exploits double asymmetrical Bragg diffraction from flat crystals to efficiently produce distortion- and aberrations-free X-ray images with magnification factors up to 150x150 and pixel sizes of less than 100x100nm2.
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Marco Stampanoni, Gunther Borchert, Rafael Abela, "Two-dimensional asymmetrical Bragg diffraction for submicrometer computer tomography", Proc. SPIE 5195, Crystals, Multilayers, and Other Synchrotron Optics, (23 December 2003); doi: 10.1117/12.503825; https://doi.org/10.1117/12.503825
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