7 January 2004 1- to 10-keV x-ray backlighting of annular wire arrays on the Sandia Z-machine using bent-crystal imaging techniques
Author Affiliations +
Abstract
Annular wire array implosions on the Sandia Z-machine can produce >200 TW and 1-2 MJ of soft x rays in the 0.1-10 keV range. The x-ray flux and debris in this environment present significant challenges for radiographic diagnostics. X-ray backlighting diagnostics at 1865 and 6181 eV using spherically-bent crystals have been fielded on the Z-machine, each with a ~ 0.6 eV spectral bandpass, 10 μm spatial resolution, and a 4 mm by 20 mm field of view. The Z-Beamlet laser, a 2-TW, 2-kJ Nd:glass laser (λ=527 nm), is used to produce 0.1-1 J x-ray sources for radiography. The design, calibration, and performance of these diagnostics is presented.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Daniel B. Sinars, David F. Wenger, Michael E. Cuneo, Guy R. Bennett, Jessica E. Anderson, John L. Porter, Patrick K. Rambo, Dean C. Rovang, Ian C. Smith, "1- to 10-keV x-ray backlighting of annular wire arrays on the Sandia Z-machine using bent-crystal imaging techniques", Proc. SPIE 5196, Laser-Generated and Other Laboratory X-Ray and EUV Sources, Optics, and Applications, (7 January 2004); doi: 10.1117/12.507785; https://doi.org/10.1117/12.507785
PROCEEDINGS
15 PAGES


SHARE
KEYWORDS
Crystals

Sensors

Diagnostics

X-rays

X-ray sources

Imaging systems

Spatial resolution

RELATED CONTENT

MAXIM: the black hole imager
Proceedings of SPIE (October 11 2004)
The Hard X ray Imager (HXI) for the ASTRO H...
Proceedings of SPIE (September 17 2012)
15 30 arcsec resolution replica x ray optics for AXAF...
Proceedings of SPIE (February 01 1994)
A system for high resolution x ray phase contrast imaging...
Proceedings of SPIE (September 18 2008)
CdZnTe arrays for astrophysics applications
Proceedings of SPIE (July 07 1997)

Back to Top