7 January 2004 1- to 10-keV x-ray backlighting of annular wire arrays on the Sandia Z-machine using bent-crystal imaging techniques
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Abstract
Annular wire array implosions on the Sandia Z-machine can produce >200 TW and 1-2 MJ of soft x rays in the 0.1-10 keV range. The x-ray flux and debris in this environment present significant challenges for radiographic diagnostics. X-ray backlighting diagnostics at 1865 and 6181 eV using spherically-bent crystals have been fielded on the Z-machine, each with a ~ 0.6 eV spectral bandpass, 10 μm spatial resolution, and a 4 mm by 20 mm field of view. The Z-Beamlet laser, a 2-TW, 2-kJ Nd:glass laser (λ=527 nm), is used to produce 0.1-1 J x-ray sources for radiography. The design, calibration, and performance of these diagnostics is presented.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Daniel B. Sinars, David F. Wenger, Michael E. Cuneo, Guy R. Bennett, Jessica E. Anderson, John L. Porter, Patrick K. Rambo, Dean C. Rovang, Ian C. Smith, "1- to 10-keV x-ray backlighting of annular wire arrays on the Sandia Z-machine using bent-crystal imaging techniques", Proc. SPIE 5196, Laser-Generated and Other Laboratory X-Ray and EUV Sources, Optics, and Applications, (7 January 2004); doi: 10.1117/12.507785; https://doi.org/10.1117/12.507785
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