X-pinch source characteristics for x-rays above 10 keV

Tatyana A Shelkovenko; Sergei A Pikuz; Vera M Romanova; Georgii V Ivanenkov; ByungMoo Song; Katherine M Chandler; Marc D Mitchell; David A Hammer

doi:10.1117/12.508749

7 January 2004 X-pinch source characteristics for x-rays above 10 keV

Tatyana A Shelkovenko, Sergei A Pikuz, Vera M Romanova, Georgii V Ivanenkov, ByungMoo Song, Katherine M Chandler, Marc D Mitchell, David A Hammer

Author Affiliations +

Proceedings Volume 5196, Laser-Generated and Other Laboratory X-Ray and EUV Sources, Optics, and Applications; (2004) https://doi.org/10.1117/12.508749
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

X pinch radiation produced by electron beams accelerated in the X pinch minidiode ranging in energy from 10 to 100 keV has been studied and used to image a variety of different objects. The experiments have been carried out using the XP pulser (470 kA, 100 ns) at Cornell University and the BIN pulser (280 kA, 120 ns) at the P.N. Lebedev Physical Institute. This electron-beam-generated x-ray source's geometric, temporal and spectral properties have been studied over different energy ranges between 10 and 100 keV. The imaging was carried out in a low magnification scheme, and spatial resolution of a few tens of μm was demonstrated.

Citation Download Citation

Tatyana A Shelkovenko, Sergei A Pikuz, Vera M Romanova, Georgii V Ivanenkov, ByungMoo Song, Katherine M Chandler, Marc D Mitchell, and David A Hammer "X-pinch source characteristics for x-rays above 10 keV", Proc. SPIE 5196, Laser-Generated and Other Laboratory X-Ray and EUV Sources, Optics, and Applications, (7 January 2004); https://doi.org/10.1117/12.508749

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