7 January 2004 X-ray line spectropolarimetry as a new diagnostic of anisotropic plasma sources
Author Affiliations +
The results of theoretical and experimental studies of anisotropic plasma sources are reported. They are based on x-ray line spectropolarimetry, a powerful new tool for investigating anisotropy of high-temperature plasmas. It is based on theoretical modeling of polarization-sensitive x-ray line spectra recorded simultaneously by two spectrometers with different sensitivities to polarization. The difference in these polarization-sensitive spectra is used to diagnose the parameters of anisotropic electron beams in plasmas. Theoretical predictions of polarization which cover a broad spectral range from K- to M-shell line radiation are presented. The results of Ti and Mo x-pinch polarization-sensitive experiments at UNR are overviewed. This diagnostic can be applied not only to x-pinches as demonstrated here but to laser-generated and other laboratory x-ray sources.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alla S. Shlyaptseva, Alla S. Shlyaptseva, Victor L. Kantsyrev, Victor L. Kantsyrev, Nick D. Ouart, Nick D. Ouart, Dmitry A. Fedin, Dmitry A. Fedin, Safeia Hamasha, Safeia Hamasha, Stephanie B. Hansen, Stephanie B. Hansen, } "X-ray line spectropolarimetry as a new diagnostic of anisotropic plasma sources", Proc. SPIE 5196, Laser-Generated and Other Laboratory X-Ray and EUV Sources, Optics, and Applications, (7 January 2004); doi: 10.1117/12.507909; https://doi.org/10.1117/12.507909


Molecular Beam Epitaxy For Multilayer Fabrication
Proceedings of SPIE (December 16 1988)
X pinch a source of 1 to 10...
Proceedings of SPIE (November 14 2001)
Attosecond x-ray laser pulses
Proceedings of SPIE (April 12 2005)
Modern x ray sources based on university scale 1 MA...
Proceedings of SPIE (September 18 2007)

Back to Top