20 January 2004 Advances in CCD detector technology for x-ray diffraction applications
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Phosphor-coupled CCDs are established as one of the most successful technologies for x-ray diffraction. This application demands that the CCD simultaneously achieve both the highest possible sensitivity and high readout speeds. Recently, wafer-scale, back illuminated devices have become available which offer significantly higher quantum efficiency than conventional devices (the Fairchild Imaging CCD 486 BI). However, since back thinning significantly changes the electrical properties of the CCD the high speed operation of wafer-scale, back-illuminated devices is not well understood. Here we describe the operating characteristics (including noise, linearity, full well capacity and CTE) of the back-illuminated CCD 486 at readout speeds up to 4 MHz.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Timothy A. Thorson, Timothy A. Thorson, Roger D. Durst, Roger D. Durst, Dan Frankel, Dan Frankel, Rex L. Bordwell, Rex L. Bordwell, Jose R. Camara, Jose R. Camara, Edward Leon-Guerrero, Edward Leon-Guerrero, Steven K. Onishi, Steven K. Onishi, Francis Pang, Francis Pang, Paul Vu, Paul Vu, Edwin M Westbrook, Edwin M Westbrook, } "Advances in CCD detector technology for x-ray diffraction applications", Proc. SPIE 5198, Hard X-Ray and Gamma-Ray Detector Physics V, (20 January 2004); doi: 10.1117/12.505710; https://doi.org/10.1117/12.505710

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