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20 January 2004 Effects of surface roughness on large-volume CdZnTe nuclear radiation detectors and removal of surface damage by chemical etching
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Abstract
This study investigates the effectiveness of chemical etchants to remove surface damage caused by mechanical polishing during the fabrication of Cd0.9Zn0.1Te (CZT) nuclear radiation detectors. We evaluate different planar CZT devices fabricated from the same CZT crystals. All detectors used electroless Au for the metal contacts. Different polishing particle sizes ranging from 22.1-μm SiC to 0.05-μm alumina were used, which caused different degrees of surface roughness. Current-voltage measurements and detector testing were used to characterize the effects of surface roughness and etching on the material and detector properties.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gomez W Wright, Giuseppe S. Camarda, Edson Kakuno, Longxia Li, Fengying Lu, Chun Lee, Arnold Burger, Jack I. Trombka, D. Peter Siddons, and Ralph B. James "Effects of surface roughness on large-volume CdZnTe nuclear radiation detectors and removal of surface damage by chemical etching", Proc. SPIE 5198, Hard X-Ray and Gamma-Ray Detector Physics V, (20 January 2004); https://doi.org/10.1117/12.510180
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