End-point energy measurement in pulsed x-ray detectors

Stephen E. Mitchell; Joshua D. Friedman; Edward J. McCrea; Herman E. Utiger

doi:10.1117/12.518576

20 January 2004 End-point energy measurement in pulsed x-ray detectors

Stephen E. Mitchell, Joshua D. Friedman, Edward J. McCrea, Herman E. Utiger

Proceedings Volume 5198, Hard X-Ray and Gamma-Ray Detector Physics V; (2004) https://doi.org/10.1117/12.518576
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

High power pulsed x-ray sources (XRS) are common place for many radiographic and plasma physics applications. Developing such XRS’s for particular applications require accurate end-point voltage and dose measurements to adequately characterize and model these devices. A simple mathematical relationship, which yields end-point energy results as function of measured peak voltage and time response, has been extracted from the data sheets and specifications of a proprietary manufactured Silicon x-ray detector (XRD). The model takes into account the fractional energy absorbed, response time, linear absorption coefficients (including both photo-electric and Compton incoherent interactions), physical geometry, and transfer function of the biasing circuit.

Citation Download Citation

Stephen E. Mitchell, Joshua D. Friedman, Edward J. McCrea, and Herman E. Utiger "End-point energy measurement in pulsed x-ray detectors", Proc. SPIE 5198, Hard X-Ray and Gamma-Ray Detector Physics V, (20 January 2004); https://doi.org/10.1117/12.518576

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