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20 January 2004 End-point energy measurement in pulsed x-ray detectors
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Abstract
High power pulsed x-ray sources (XRS) are common place for many radiographic and plasma physics applications. Developing such XRS’s for particular applications require accurate end-point voltage and dose measurements to adequately characterize and model these devices. A simple mathematical relationship, which yields end-point energy results as function of measured peak voltage and time response, has been extracted from the data sheets and specifications of a proprietary manufactured Silicon x-ray detector (XRD). The model takes into account the fractional energy absorbed, response time, linear absorption coefficients (including both photo-electric and Compton incoherent interactions), physical geometry, and transfer function of the biasing circuit.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stephen E. Mitchell, Joshua D. Friedman, Edward J. McCrea, and Herman E. Utiger "End-point energy measurement in pulsed x-ray detectors", Proc. SPIE 5198, Hard X-Ray and Gamma-Ray Detector Physics V, (20 January 2004); https://doi.org/10.1117/12.518576
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