20 January 2004 Multispectral x-ray and gamma spectrometer
Author Affiliations +
Abstract
It is well known that the attenuation length of radiation in any dense material increases with radiation energy. We propose a novel method of measuring x-ray and gamma spectra based on this principle. The multispectral x-ray and gamma spectrometer concept employs a scintillating material and optical camera system coupled via optical fibers. The optical fibers are placed sequentially at increasing depth with respect to the radiation path along the length of the scintillating material. Light generated by the interaction of radiation with the scintillating material is transported to the camera for recording and subsequent analysis. The proposed system will be used to determine the spectrum of incident radiation by deconvolving the radiation spectrum from the optical intensity (as a function of depth) of the recorded signals.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Alfred Meidinger, Alfred Meidinger, Jennifer Sloane-Warren, Jennifer Sloane-Warren, Craig A. Kruschwitz, Craig A. Kruschwitz, Paul O. Frederickson, Paul O. Frederickson, Robert A. Hilko, Robert A. Hilko, Michael J. Berninger, Michael J. Berninger, Thomas W. Tunnell, Thomas W. Tunnell, Dan Keith Frayer, Dan Keith Frayer, Donald V. Rosenberry, Donald V. Rosenberry, } "Multispectral x-ray and gamma spectrometer", Proc. SPIE 5198, Hard X-Ray and Gamma-Ray Detector Physics V, (20 January 2004); doi: 10.1117/12.506831; https://doi.org/10.1117/12.506831
PROCEEDINGS
8 PAGES


SHARE
RELATED CONTENT


Back to Top