Single-sided x-ray inspection of vehicles using AS&E's Z-Backscatter Van

Alex Chalmers

doi:10.1117/12.505800

30 December 2003 Single-sided x-ray inspection of vehicles using AS&E's Z-Backscatter Van

Alex Chalmers

Proceedings Volume 5199, Penetrating Radiation Systems and Applications V; (2003) https://doi.org/10.1117/12.505800
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

A compact mobile single sided vehicle inspection system is presented employing backscatter x-ray imaging. Major system components are described as well as its intended applications. Sample images are shown from recent scans of small and large vehicles at a range of scan speeds and distances. Various types of contraband and threat types are shown to be detected.

Citation Download Citation

Alex Chalmers "Single-sided x-ray inspection of vehicles using AS&E's Z-Backscatter Van", Proc. SPIE 5199, Penetrating Radiation Systems and Applications V, (30 December 2003); https://doi.org/10.1117/12.505800

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available